Which advanced technique can analyze atoms in a sample with high precision?

Atom probe tomography is the advanced technique that can analyze atoms in a sample with high precision. This method enables researchers to obtain three-dimensional reconstructions of materials at the atomic level. Using a sharp needle-like tip, it allows for the sequential removal of atoms from the surface of a sample. The ions generated from this process are then analyzed using a time-of-flight mass spectrometer, providing highly detailed compositional and spatial information about the sample being studied.

The precision of atom probe tomography is essential in fields such as materials science, nanotechnology, and semiconductor analysis, where understanding the arrangement and type of atoms at the nanoscale can significantly impact the properties of a material or device. The ability to detect individual atoms and their isotopes makes this technique uniquely powerful for applications requiring high accuracy in atomic-level analyses.